发明名称 Combination of ellipsometry and optical stress generation and detection
摘要 A method includes selecting one of performing ellipsometry or performing optical stress generation and detection. The method also includes, in response to selecting performing ellipsometry, applying at least one first control signal to a controllable retarder that modifies at least polarization of a light beam, and performing ellipsometry using the modified light beam. The method further includes, in response to selecting performing optical stress generation and detection, applying at least one second control signal to the controllable retarder, and performing optical stress generation and detection using the modified light beam. Apparatus and computer readable media are also disclosed.
申请公布号 US2009244516(A1) 申请公布日期 2009.10.01
申请号 US20070309166 申请日期 2007.07.09
申请人 MEHENDALE MANJUSHA;KOTELYANSKII MICHAEL J;HOU YANWEN;ONDERKO JIM;TAS GURAY 发明人 MEHENDALE MANJUSHA;KOTELYANSKII MICHAEL J.;HOU YANWEN;ONDERKO JIM;TAS GURAY
分类号 G01B11/16 主分类号 G01B11/16
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