发明名称 Verfahren zur Herstellung einer Halbleiteranordnung mit gemischter Orientierung
摘要 A method of making a semiconductor device begins with a semiconductor wafer that includes a first semiconductor layer overlying a second semiconductor layer. A first trench is etched in the semiconductor wafer. The first trench is filled with insulating material. A second trench is etched within the first trench and through the insulating material, such that insulating material remains along sidewalls of the first trench. The second trench exposes a portion of the second insulating layer. A semiconductor layer can then be grown within the second trench using the second semiconductor layer as a seed layer.
申请公布号 DE102006060887(B4) 申请公布日期 2009.10.01
申请号 DE20061060887 申请日期 2006.12.22
申请人 INFINEON TECHNOLOGIES AG 发明人 SHUM, DANNY PAK-CHUM;TILKE, ARMIN;YAN, JIANG
分类号 H01L21/8238;H01L21/762;H01L27/092 主分类号 H01L21/8238
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