发明名称 |
PHASE-CHANGE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PURPOSE: A phase change memory device and a manufacturing method thereof are provided to prevent damage due to etching of a phase change material layer. CONSTITUTION: A first electrode(410) is formed inside a first insulation layer(400) formed on a semiconductor substrate(100), and penetrates the first insulation layer. A plurality of trenches is extended into a first direction in order to expose the first electrode. A mold insulation layer having the trenches is formed on the first insulation layer. A phase change material layer(600) is formed on the mold insulation layer, is filled in the trenches, and is commonly connected with the first electrode. A second electrode line pattern(700) is formed on the phase change material layer, and is extended into a second direction different from the first direction.
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申请公布号 |
KR20090103609(A) |
申请公布日期 |
2009.10.01 |
申请号 |
KR20080029324 |
申请日期 |
2008.03.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, JEONG HEE;HA, YONG HO;KANG, MYUNG JIN;PARK, DOO HWAN;KWON, HYUN SUK |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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