发明名称 PHASE-CHANGE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PURPOSE: A phase change memory device and a manufacturing method thereof are provided to prevent damage due to etching of a phase change material layer. CONSTITUTION: A first electrode(410) is formed inside a first insulation layer(400) formed on a semiconductor substrate(100), and penetrates the first insulation layer. A plurality of trenches is extended into a first direction in order to expose the first electrode. A mold insulation layer having the trenches is formed on the first insulation layer. A phase change material layer(600) is formed on the mold insulation layer, is filled in the trenches, and is commonly connected with the first electrode. A second electrode line pattern(700) is formed on the phase change material layer, and is extended into a second direction different from the first direction.
申请公布号 KR20090103609(A) 申请公布日期 2009.10.01
申请号 KR20080029324 申请日期 2008.03.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, JEONG HEE;HA, YONG HO;KANG, MYUNG JIN;PARK, DOO HWAN;KWON, HYUN SUK
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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