发明名称 APPARATUS AND METHOD FOR ANALYZING A SIGNAL UNDER TEST
摘要 A portion of a signal under test corresponding to a portion of interest in an eye pattern is easily identified. An eye pattern display area displays an eye pattern that is derived from sample data of a signal under test in a bitmap form and shows frequency information with colors or brightness. A user selects an arbitrary point on the eye pattern display area with a cross-hair shaped mouse cursor, by manipulating a mouse. Thereafter, a waveform passing through the selected point is discriminably displayed, for example, with highlighted display on the eye pattern. Further, the corresponding portion of a waveform in the waveform display area is distinguishably displayed, such as with a highlighted display.
申请公布号 US2009245339(A1) 申请公布日期 2009.10.01
申请号 US20080055210 申请日期 2008.03.25
申请人 TEKTRONIX, INC. 发明人 OBATA TOSHIAKI
分类号 H04B17/00;G06T11/20 主分类号 H04B17/00
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