IMPROVEMENT OF SPECTRAL AND/OR SPATIAL RESOLUTION IN A LASER SCANNING MICROSCOPE

摘要

The method involves detecting a signal scattered, reflected, fluoresced or transmitted by the specimen with a position resolving detector. An image of the radiation from the specimen is formed on the detector and the position of the position-resolved measured radiation relative to the detector is shifted. Intermediate values are computed from the signals for different displacements to increase spatial resolution. An independent claim is included for an arrangement for optical detection of characteristic parameters of an illuminated specimen.