发明名称 |
Calibration for a non-desctructive inspection system |
摘要 |
<p>The method involves moving a common holding device by pivoting systems and/or linear movement systems along a trajectory over a surface of a workpiece to be tested so that a scanning curve (2) on the surface of the workpiece is scanned. An offset value is determined for ultrasonic transducers (1) e.g. optical sensors, where the offset value indicates an offset between a radiation direction of the transducers and the curve. An optimal adjustment of the holding device is determined from the offset value to optimize the offset of the transducers. An independent claim is also included for a device non-destructive testing of material of a workpiece.</p> |
申请公布号 |
EP2105738(A2) |
申请公布日期 |
2009.09.30 |
申请号 |
EP20090154649 |
申请日期 |
2009.03.09 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
HAIN, STEFAN;MOOSHOFER, HUBERT;DE CARVALHO FERREIRA, FABRICIO |
分类号 |
G01N29/265;G01N29/30 |
主分类号 |
G01N29/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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