| 摘要 |
A SEMICONDUCTOR TEST APPARATUS (10) COMPRSING A TEST APPARATUS MAIN BODY (300) FOR GENERATING A TEST PATTERN PROVIDED TO A SEMICONDUCTOR DEVICE (106), A TEST HEAD (100) WHICH CONTACTS THE SEMICONDUCTOR DEVICE (106) AND PROVIDES THE TEST PATTERN GENERATED BY THE TEST APPARATUS MAIN BODY (300) FOR THE SEMICONDUCTOR DEVICE (106), A CABLE (400) FOR DELIVERING THE TEST PATTERN TO THE TEST HEAD (100) FROM THE TEST APPARATUS MAIN BODY (300) AND A MOVABLE SUPPORTING UNIT (200) FOR MOVING IN A DIRECTION TO RELEASE TENSION WHEN TENSION OCCURS IN THE CABLE (400) WHILE HOLDING THE CABLE (400).
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