发明名称 |
OPERATING METHOD OF MEMORY DEVICE REDUCING LATERAL MOVEMENT OF CHARGES |
摘要 |
PURPOSE: A method for operating a memory device is provided to implement a negative valid effect test voltage below 0 V while applying the voltage of 0V or more to a control gate of the memory cell. CONSTITUTION: A pre-program voltage is applied to a memory cell of an erase state(S110). The memory cell is pre-programmed to have a smaller threshold voltage distribution in comparison with the erase state. Whether the memory cell is pre-programmed is verified using the negative valid verification voltage(S130).
|
申请公布号 |
KR20090102262(A) |
申请公布日期 |
2009.09.30 |
申请号 |
KR20080027592 |
申请日期 |
2008.03.25 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SEOL, KWANG SOO;JIN, YOUNG GU;PARK, YOON DONG |
分类号 |
G11C16/34;G11C16/10;G11C16/12 |
主分类号 |
G11C16/34 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|