| 摘要 |
PURPOSE: A test tray, an apparatus for discriminating a tray, and a test handler including the same are provided to efficiently discriminate an ID of a test tray without interference about transfer of a test tray. CONSTITUTION: A test handler(100) includes a preheating chamber(150), a tray transfer part, a tray discriminating part(300), and a test chamber(160). The preheating chamber heats a plurality of semiconductor devices transferred from outside. The tray transfer part transfers the test tray inside the preheating chamber. The test tray includes an ID block having at least one through hole. The tray discriminating part includes a light emitting part and a light receiving part. The light emitting part is positioned in an opposite side of the through hole of the test tray. The light emitting part irradiates a light. The light receiving part receives a light from the light emitting part. The tray discriminating part obtains position information of the through hole by using the light emitting part and the light receiving part. The test chamber provides a space for testing the semiconductor devices mounted on the test tray. |
