发明名称 |
On-Chip AC self-test controller |
摘要 |
A system for performing AC self-test on an integrated circuit that includes a system clock for normal operation is provided. The system includes the system clock, self-test circuitry, a first and second test register to capture and launch test data in response to a sequence of data pulses, and a logic circuit to be tested. The self-test circuitry includes an AC self-test controller and a clock splitter. The clock splitter generates the sequence of data pulses including a long data capture pulse followed by an at speed data launch pulse and an at speed data capture pulse followed by a long data launch pulse. The at speed data launch pulse and the at speed data capture pulse are generated for a common cycle of the system clock.
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申请公布号 |
US7596734(B2) |
申请公布日期 |
2009.09.29 |
申请号 |
US20080185172 |
申请日期 |
2008.08.04 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
FLANAGAN JOHN D.;HERRING JAY R.;LO TIN-CHEE |
分类号 |
G01R31/28;G01R31/317;G01R31/319 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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