发明名称 Test apparatus, clock generator and electronic device
摘要 There is provided a clock generator for generating a single-phase clock into which jitter has been injected, having a multi-phase clock generating section for generating a plurality of clock signals having an almost equal phase difference from each other and a jitter injecting section for injecting jitter into the respective clock signals.
申请公布号 US7596173(B2) 申请公布日期 2009.09.29
申请号 US20050260665 申请日期 2005.10.28
申请人 ADVANTEST CORPORATION 发明人 ISHIDA MASAHIRO;YAMAGUCHI TAKAHIRO;SOMA MANI
分类号 H04B3/46 主分类号 H04B3/46
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