发明名称 ADVANCED PATTERN RECOGNITION SYSTEMS FOR SPECTRAL ANALYSIS
摘要 A process of rapid and highly accurate analysis of spectral data, includes both a linear scanning (LINSCAN) method and an advanced peak detection method for pattern recognition. One or both of the methods are used to support the detection and identification of chemical, biological, radiation, nuclear and explosive materials. The spectra of various targets can be analyzed by the two spectral analysis methods. These two methods can be combined for dual confirmation, greater accuracy, and to reduced false positives and false negatives, relative to what can be accomplished by either alone.
申请公布号 KR20090101380(A) 申请公布日期 2009.09.25
申请号 KR20097016976 申请日期 2008.01.17
申请人 INNOVATIVE AMERICAN TECHNOLOGY, INC. 发明人 CAULFIELD H. J.;FRANK DAVID L.;SETER JAMIE L.
分类号 G01N21/25;G01J3/28;G01T1/161 主分类号 G01N21/25
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