发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE, NONVOLATILE MEMORY ARRAY, AND METHOD OF MANUFACTURING NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To simplify a structure of a nonvolatile semiconductor memory device. <P>SOLUTION: A floating gate 40 consisting of polysilicon is formed on a semiconductor substrate 20 through a gate insulating film 30. A sidewall insulating film 50 is provided on both sidewalls of the floating gate 40. A diffusion layer 60 is provided in the semiconductor substrate 20 and it is separated from the floating gate 40 by a predetermined distance. A diffusion layer 70 is provided in the semiconductor substrate 20 so as to overlap with the floating gate 40 in a channel width direction and in a channel length direction of a channel region. A high voltage is applied to the diffusion layer 70 which has capacitance coupling with the floating gate 40, so that electrons are injected into the floating gate 40. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009218546(A) 申请公布日期 2009.09.24
申请号 JP20080166507 申请日期 2008.06.25
申请人 SANYO ELECTRIC CO LTD 发明人 YAMADA KOICHI
分类号 H01L21/8247;G11C16/04;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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