发明名称 SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To improve a yield while suppressing increase of manufacturing cost, in a semiconductor device and manufacturing method thereof. SOLUTION: This semiconductor device includes: a silicon (semiconductor) substrate 1; an element separation insulation film 6 formed on the silicon substrate 1; a conductive pattern 13a formed on the silicon substrate 1 and the element separation insulation film 6, and having side surfaces 13e on the element separation insulation film 6; and an insulation film 16 formed on the element separation insulation film 6, the conductive pattern 13 and the side surfaces 13e of the conductive pattern 13a. Notches 13w are formed on the side surfaces 13e of the conductive pattern 13a. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009218520(A) 申请公布日期 2009.09.24
申请号 JP20080063389 申请日期 2008.03.12
申请人 FUJITSU MICROELECTRONICS LTD 发明人 TAKAHASHI MAKOTO;ENDO MINORU
分类号 H01L21/3213;H01L21/3065;H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/3213
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