发明名称 |
SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To improve a yield while suppressing increase of manufacturing cost, in a semiconductor device and manufacturing method thereof. SOLUTION: This semiconductor device includes: a silicon (semiconductor) substrate 1; an element separation insulation film 6 formed on the silicon substrate 1; a conductive pattern 13a formed on the silicon substrate 1 and the element separation insulation film 6, and having side surfaces 13e on the element separation insulation film 6; and an insulation film 16 formed on the element separation insulation film 6, the conductive pattern 13 and the side surfaces 13e of the conductive pattern 13a. Notches 13w are formed on the side surfaces 13e of the conductive pattern 13a. COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009218520(A) |
申请公布日期 |
2009.09.24 |
申请号 |
JP20080063389 |
申请日期 |
2008.03.12 |
申请人 |
FUJITSU MICROELECTRONICS LTD |
发明人 |
TAKAHASHI MAKOTO;ENDO MINORU |
分类号 |
H01L21/3213;H01L21/3065;H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/3213 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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