SEMICONDUCTOR INTEGRATED CIRCUIT, MANUFACTURING METHOD OF THE SAME, AND PROBE CARD

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit for correctly writing at a time discrimination data to a plurality of semiconductor integrated circuits and for reducing cost required for writing of these discrimination data. SOLUTION: In the case of a semiconductor integrated circuit IC3, the discrimination data are written at a time to the plurality of semiconductor integrated circuits under the wafer state. As the discrimination data, the reference discrimination data that are the discrimination data of the reference semiconductor integrated circuit ICref among the plurality of semiconductor integrated circuits are input to generate location data in accordance with location of the wafer itself based on the location data showing the location of the reference semiconductor integrated circuit ICref in the wafer among such reference discrimination data. COPYRIGHT: (C)2009,JPO&INPIT