发明名称 Correlated double sampling technique
摘要 A sampling circuit according to correlated double sampling to generate a difference of two voltages at a sampling node, with the second voltage representing the sum of an input signal and an offset, and the first voltage representing the offset alone. In an embodiment, a first capacitor is charged to the first voltage in a first phase. A second capacitor is then charged to the second voltage in a second phase. In a third phase, the first capacitor is coupled to the input terminal of the amplifier and the second capacitor is coupled between the input and output terminals of the amplifier to cause the amplifier to generate the difference of the first and second voltages. The first capacitor has a capacitance much less than the second capacitor, thereby minimizing the noise power at the output of the amplifier.
申请公布号 US2009237121(A1) 申请公布日期 2009.09.24
申请号 US20080051839 申请日期 2008.03.19
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 SURENDRANATH NAGESH;MANDAL DIPANKAR
分类号 G11C27/02 主分类号 G11C27/02
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