发明名称 PACKING STRUCTURE FOR INSPECTION COMPONENT
摘要 PROBLEM TO BE SOLVED: To suppress damage to an electrode by a rotor by hardly bringing the rotor into contact with the electrode when a packing structure of an inspection component is transported. SOLUTION: The packing structure of the inspection component is equipped with a bacteria measuring member 21, a receiving putt 14 and a magnet sheet 13. The bacteria measuring member 21 has a measuring cell 1, the electrode 2 exposed in the measuring cell 1, and the rotor 3 freely movable in the measuring cell 1. The receiving putt 14 stores the bacteria measuring member 21. The magnet sheet 13 magnetically sucks the rotor 3 to a specified position where the rotor 3 is not brought into contact with the electrode 2 under a condition that the bacteria measuring member 21 is stored in the receiving putt 14. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009214894(A) 申请公布日期 2009.09.24
申请号 JP20080058599 申请日期 2008.03.07
申请人 PANASONIC CORP 发明人 OTA SHINMEI;OUCHI KAZUFUMI
分类号 B65D81/02;B65D85/38 主分类号 B65D81/02
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