发明名称 PATTERN MEASUREMENT METHODS AND PATTERN MEASUREMENT EQUIPMENT
摘要 An object of the present invention is to provide methods and equipment capable of providing highly accurate matching using a template including multiple patterns even when the shapes of some patterns of the template are different from corresponding ones of a SEM image, and when the template and the SEM image have a magnification error. Proposed, as a technique for achieving the object, is a method for performing matching by selectively using some of multiple patterns provided in a predetermined region of design data, and equipment for implementing the method. Moreover, proposed, as another technique for achieving the object, is a method for performing first matching by using multiple patterns provided in a predetermined region of design data and thereafter performing second matching by using some of the multiple patterns provided in the predetermined region, and equipment for implementing the method.
申请公布号 US2009238443(A1) 申请公布日期 2009.09.24
申请号 US20090389885 申请日期 2009.02.20
申请人 SATO HIDETOSHI;MATSUOKA RYOICHI 发明人 SATO HIDETOSHI;MATSUOKA RYOICHI
分类号 G06K9/62;G01B15/04;G03F1/36;G03F1/84;G06K9/00;H01J37/22;H01L21/027;H01L21/66 主分类号 G06K9/62
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