发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAID DEVICE
摘要 <p>Provided is a semiconductor device comprised of a channel layer of a nitrogen-containing Group 3 - 5 compound semiconductor, an electron supply layer which supplies electrons to the channel layer and has a trench in the surface opposite the surface facing the channel layer, a p-type semiconductor layer formed in the trench of the electron supply layer, and a control electrode formed adjacent to the p-type semiconductor layer or formed as an intermediate layer in the p-type semiconductor layer. For example, the channel current density increases while a GaN field effect transistor, which is the semiconductor device, is operated as normally off.</p>
申请公布号 WO2009116283(A1) 申请公布日期 2009.09.24
申请号 WO2009JP01209 申请日期 2009.03.18
申请人 SUMITOMO CHEMICAL COMPANY, LIMITED;SAZAWA, HIROYUKI;NISHIKAWA, NAOHIRO;KURITA, YASUYUKI;HATA, MASAHIKO 发明人 SAZAWA, HIROYUKI;NISHIKAWA, NAOHIRO;KURITA, YASUYUKI;HATA, MASAHIKO
分类号 H01L21/338;H01L21/28;H01L21/336;H01L21/337;H01L29/12;H01L29/423;H01L29/49;H01L29/778;H01L29/78;H01L29/808;H01L29/812 主分类号 H01L21/338
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