METHOD FOR THE ANALYSIS OF SAMPLES AND SAMPLE

摘要

The present invention relates to a method for the analysis of a sample by means of radiation, for example using X-ray techniques. The method comprises a first step of providing a substrate, for example a filter, having an substantially flat shape and comprising a first and a second main surface. The method further comprises a step of depositing an analyte on the substrate, for example a particulate, and a step of coating at least a first area comprising the analyte of at least one of the main surfaces with a layer or film, to obtain a sample at least partially coated. Such film is at least partially permeable to the radiation used in the analysis. Furthermore the method comprises a step of analysing the first coated area of the sample by means of the radiation passing through the film.