发明名称 |
SONOS DEVICE WITH INSULATING STORAGE LAYER AND P-N JUNCTION ISOLATION |
摘要 |
The present invention provides a semiconductor device and a method for manufacturing thereof. The semiconductor device includes bit lines disposed in a semiconductor substrate, a first ONO disposed between the bit lines on the semiconductor substrate, and a second ONO film disposed on each of the bit lines. The film thickness of a first silicon nitride film in the first ONO film is larger than the film thickness of a second silicon nitride film in the second ONO film.
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申请公布号 |
US2009237990(A1) |
申请公布日期 |
2009.09.24 |
申请号 |
US20080235321 |
申请日期 |
2008.09.22 |
申请人 |
MURAI HIROSHI;HIGASHI MASAHIKO |
发明人 |
MURAI HIROSHI;HIGASHI MASAHIKO |
分类号 |
G11C16/04;G11C11/34;H01L21/336;H01L29/792 |
主分类号 |
G11C16/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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