发明名称 SONOS DEVICE WITH INSULATING STORAGE LAYER AND P-N JUNCTION ISOLATION
摘要 The present invention provides a semiconductor device and a method for manufacturing thereof. The semiconductor device includes bit lines disposed in a semiconductor substrate, a first ONO disposed between the bit lines on the semiconductor substrate, and a second ONO film disposed on each of the bit lines. The film thickness of a first silicon nitride film in the first ONO film is larger than the film thickness of a second silicon nitride film in the second ONO film.
申请公布号 US2009237990(A1) 申请公布日期 2009.09.24
申请号 US20080235321 申请日期 2008.09.22
申请人 MURAI HIROSHI;HIGASHI MASAHIKO 发明人 MURAI HIROSHI;HIGASHI MASAHIKO
分类号 G11C16/04;G11C11/34;H01L21/336;H01L29/792 主分类号 G11C16/04
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