| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC-package inspecting socket capable of preventing production of stresses in the package body of an IC package and external leads, and is excellent in contact reliability. SOLUTION: The socket 10 is provided with a large number of electric contacts 12 and a cover 50. Each of the electric contacts 12 has a lower contact arm 22 which is united to a part 18 to be fixed to a base 14 via a spring part 24, and supports the base end part 4a of an external lead 4 adjoining the package body 6 of the IC package 8, and an upper contact arm 26 which presses the base end part 4a of the external lead 4 from the upside. The cover 50 engages with an operating lever 30 provided on the upper arm 26, and rotates the upper arm 26 between an open position where the IC package 8 is freely approachable to the upside of the lower arm 22, and a press position where the base end part 4a of the external lead 4 is pressed downwards and the lower arm 22 is displaced downwards while resisting the urging force of the spring part 24. COPYRIGHT: (C)2009,JPO&INPIT
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