发明名称 COAXIAL MICROWAVE ASSISTED DEPOSITION AND ETCH SYSTEMS
摘要 <p>Disclosed are systems for achieving improved film properties by introducing additional processing parameters, such as a movable position for the microwave source and pulsing power to the microwave source, and extending the operational ranges and processing windows with the assistance of the microwave source. A coaxial microwave antenna is used for radiating microwaves to assist in physical vapor deposition (PVD) or chemical vapor deposition (CVD) systems. The system may use a coaxial microwave antenna inside a processing chamber, with the antenna being movable between a substrate and a plasma source, such as a sputtering target, a planar capacitively generated plasma source, or an inductively coupled source. In a special case when only a microwave plasma source is present, the position of the microwave antenna is movable relative to a substrate. The coaxial microwave antenna adjacent to the plasma source can assist the ionization more homogeneously and allow substantially uniform deposition over large areas.</p>
申请公布号 WO2009117229(A2) 申请公布日期 2009.09.24
申请号 WO2009US35325 申请日期 2009.02.26
申请人 APPLIED MATERIALS, INC.;STOWELL, MICHAEL, W.;KRISHNA, NETY;HOFMANN, RALF;GRIFFITH, JOE 发明人 STOWELL, MICHAEL, W.;KRISHNA, NETY;HOFMANN, RALF;GRIFFITH, JOE
分类号 C23C16/511;C23C14/22;H01L21/203;H01L21/205;H01L21/302 主分类号 C23C16/511
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