| 摘要 |
An optical imaging apparatus for inspecting a solar cell includes a power supply configured to apply a reverse biased voltage to the solar cell such that shunt defects in the solar cell will generate heat, a thermal imaging device configured to obtain the thermal image of the solar cell, a computing unit including a thermal image analysis module configured to identify hot spots in the thermal image, a locating module configured to locate the center positions of the hot spots, a visible image analysis module configured to identify the defect features of the hot spots, and a visible light imaging device configured to acquire visible images of the hot spots.
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