发明名称 COMPONENT TESTING DEVICE AND COMPONENT CONVEYANCE METHOD
摘要 PROBLEM TO BE SOLVED: To provide a component testing device and a component conveyance method for arranging flexibly an electronic component even onto a function station whose configuration of arrangement or the like is changed according to a test content or the like, by heightening flexibility of conveyance or arrangement of the electronic component by conveyance hands. SOLUTION: This component testing device includes two conveyance hands 50A, 50B for conveying the electronic component T to a component testing part. Each conveyance hand 50A, 50B is moved in the horizontal direction independently, and index units 60A, 60B, 60C movable in the vertical direction independently are arranged adjacently in the moving direction, on each conveyance hand 50A, 50B. The electronic component T is arranged in due order with respect to each test socket Sc1-Sc3 for performing each different test, based on each independent successive movement of the conveyance hands 50A, 50B and the index units 60A, 60B, 60C. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009216592(A) 申请公布日期 2009.09.24
申请号 JP20080061452 申请日期 2008.03.11
申请人 SEIKO EPSON CORP 发明人 SHIOZAWA MASAKUNI;FUJIMORI HIROAKI
分类号 G01R31/26 主分类号 G01R31/26
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