| 摘要 |
A system for testing semiconductor device and a test handler extending the test function of head main body into the interface block is provided to prevent the developing that causes the test error by removing the heat generated in the interface block, especially the testing board. An interface block(310) applied to the improved system for testing semiconductor device comprises an interface board(311), a testing board(312) and a head connection board(313). The interface board has a circuit board(311a), a plurality of test sockets(311b) and an interface board connector(311c). The testing board comprises a circuit board(312a), a first testing board connector(312b), an interface board connector(311c) and a second testing board connector(312d). A head connection board(313) comprises a circuit board(313a), a head connection board connector(313b) and a testing board second connector. The head connection board is electrically connected to head main body with a connecting cable(CC). |
