发明名称 APPARATUS FOR REPAIR SIGNAL GENERATING OF NON VOLATILE MEMORY DEIVCE
摘要 An apparatus for generating a repair signal of a non volatile memory device is provided to reduce the current consumption. A unit address fuse unit(500) comprises an address fuse unit activation unit(510), an address storage(520) and a repair signal output unit(530). According to the cutting state of fuse, the address fuse unit activation unit activates the unit address fuse unit. The address fuse unit activation unit comprises a first NMOS transistor, a fuse, an inverter, a second NMOS transistor and a capacitor type NMOS transistor. The address storage comprises a plurality of unit storages serially connected between the address activation unit and the repair signal output unit. According to the state of the address storage, the repair signal output unit outputs the repair.
申请公布号 KR20090098444(A) 申请公布日期 2009.09.17
申请号 KR20080023844 申请日期 2008.03.14
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YUN, IN SUK
分类号 G11C29/00;G11C16/34 主分类号 G11C29/00
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