| 摘要 |
PROBLEM TO BE SOLVED: To enhance an yield caused by a defect by relieving the relevant defect in an analog circuit of a column processing section. SOLUTION: In a column processing section 13A, current sources 32-1 to 32-4 and comparators 33-1 to 33-4, which are portions of an analog circuit, are provided more than the number of pixel columns one by one and in a case where there is a defect in a certain current source or comparator, it is substituted with another normal current source or comparator, namely, the portions in the analog circuit of the column processing section 13A are configured redundantly. On the basis of shift register information in a predetermined shift register 36, a defective portion is substituted with a normal circuit. COPYRIGHT: (C)2009,JPO&INPIT
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