发明名称 Semiconductor device having silicon layer in a gate electrode
摘要 A method for forming a semiconductor device includes, in order, consecutively depositing a gate insulating film and a silicon layer on a semiconductor substrate, implanting boron into the silicon layer, diffusing the boron by heat-treating the silicon layer, implanting phosphorous into the silicon layer, diffusing at least the phosphorous by heat-treating the silicon layer, and patterning the silicon layer by using a dry etching technique.
申请公布号 US2009233433(A1) 申请公布日期 2009.09.17
申请号 US20090453737 申请日期 2009.05.20
申请人 ELPIDA MEMORY, INC. 发明人 YAMADA SATORU;NAGAI RYO
分类号 H01L21/28 主分类号 H01L21/28
代理机构 代理人
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