TEST PATTERN CUSTOMIZATION OF HIGH SPEED SAS NETWORKS IN A MANUFACTURING TEST SYSTEM

摘要

A method for testing a high-speed serial interface, comprising: generating a customized stress test pattern configured to violate an 8bit/10bit-encoding scheme into an expander, the customized stress test pattern is configured to stress the high-speed serial interface beyond marginal limits resulting in less testing to force errors within the high-speed serial interface; transmitting the customized stress test pattern from a transmit port of a first serializer/deserializer device of the high-speed serial interface; and monitoring a receive port of a second serializer/deserializer device to detect errors within the high-speed serial interface.