发明名称 DRY ETCHING METHOD AND DRY ETCHING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To increase an etching rate and a resist selection ratio. <P>SOLUTION: A dry etching method of using a mixed gas of a plurality of fluorine-based gases as a process gas, generating plasma in a high vacuum while supplying the process gas and applying low frequency bias power to perform etching is provided to solve the problem. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009212289(A) 申请公布日期 2009.09.17
申请号 JP20080053532 申请日期 2008.03.04
申请人 FUJIFILM CORP 发明人 TAKAHASHI HIDEJI
分类号 H01L21/3065;H01L21/8246;H01L27/105;H01L41/09;H01L41/18;H01L41/22;H01L41/332 主分类号 H01L21/3065
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