摘要 |
<P>PROBLEM TO BE SOLVED: To increase an etching rate and a resist selection ratio. <P>SOLUTION: A dry etching method of using a mixed gas of a plurality of fluorine-based gases as a process gas, generating plasma in a high vacuum while supplying the process gas and applying low frequency bias power to perform etching is provided to solve the problem. <P>COPYRIGHT: (C)2009,JPO&INPIT |