发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To form an ohmic electrode of low contact resistance on the surface of a p-type nitride semiconductor processed by dry etching. SOLUTION: The manufacturing method of a semiconductor includes: a process of exposing the p-type region of a nitride semiconductor by dry etching; a cover layer forming process of forming a cover layer containing magnesium on the surface of the p-type region exposed by dry etching; an annealing process of annealing the nitride semiconductor on which the cover layer is formed; and an electrode forming process of forming the ohmic electrode on the surface of the p-type region where the cover layer is formed. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009212183(A) |
申请公布日期 |
2009.09.17 |
申请号 |
JP20080051687 |
申请日期 |
2008.03.03 |
申请人 |
TOYOTA CENTRAL R&D LABS INC;TOYOTA MOTOR CORP |
发明人 |
KIKUTA DAIGO;KANECHIKA MASAKAZU;ISHIGURO OSAMU;SUGIMOTO MASAHIRO |
分类号 |
H01L21/28;H01L21/225;H01L21/338;H01L29/778;H01L29/80;H01L29/812 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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