发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To form an ohmic electrode of low contact resistance on the surface of a p-type nitride semiconductor processed by dry etching. SOLUTION: The manufacturing method of a semiconductor includes: a process of exposing the p-type region of a nitride semiconductor by dry etching; a cover layer forming process of forming a cover layer containing magnesium on the surface of the p-type region exposed by dry etching; an annealing process of annealing the nitride semiconductor on which the cover layer is formed; and an electrode forming process of forming the ohmic electrode on the surface of the p-type region where the cover layer is formed. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009212183(A) 申请公布日期 2009.09.17
申请号 JP20080051687 申请日期 2008.03.03
申请人 TOYOTA CENTRAL R&D LABS INC;TOYOTA MOTOR CORP 发明人 KIKUTA DAIGO;KANECHIKA MASAKAZU;ISHIGURO OSAMU;SUGIMOTO MASAHIRO
分类号 H01L21/28;H01L21/225;H01L21/338;H01L29/778;H01L29/80;H01L29/812 主分类号 H01L21/28
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