发明名称 SURFACE INSPECTION APPARATUS AND SURFACE INSPECTION METHOD
摘要 <p>Provided is a technique capable of inspecting an organic EL residue on the surface of an object to be inspected. An inspection area (20) of the surface of an object to be inspected (15) is irradiated with ultraviolet light (31) while being observed through a polarizing filter (13). Reflected ultraviolet light (32) reflected by the inspection area (20) is shielded by the polarizing filter (13), and the light is not observed. However, when an organic EL residue (24) exists in the inspection area (20), the organic EL residue (24) emits light and visible light (33) is transmitted through the polarizing filter (13), so that the light is observed through the polarizing filter (13) and the existence of the organic EL residue (24) can be seen.</p>
申请公布号 WO2009113478(A1) 申请公布日期 2009.09.17
申请号 WO2009JP54392 申请日期 2009.03.09
申请人 ULVAC, INC.;MIHARA, YASUO 发明人 MIHARA, YASUO
分类号 G01N21/88;G01N21/94 主分类号 G01N21/88
代理机构 代理人
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