发明名称 |
METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a silicon carbide semiconductor device that has good adhesion between a silicon carbide substrate and a carbon layer and suppresses a deviation in composition of Si and C of a silicon carbide substrate surface after carbon layer removal. SOLUTION: The method of manufacturing the silicon carbide semiconductor device includes the stages of: (a) implanting impurity ions into base layers 1 and 2 made of silicon carbide; (b) forming the carbon layer 5 on the base layers 1 and 2 by heating in a pressure-reduced atmosphere after the stage (a); (c) forming a carbon deposit layer 6 on the carbon layer 5 formed in the stage (b); (d) performing annealing to activate the impurity ions after the stage (c); and (e) removing the carbon layer 5 and carbon deposit layer 6 after the stage (d). COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009212325(A) |
申请公布日期 |
2009.09.17 |
申请号 |
JP20080054383 |
申请日期 |
2008.03.05 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
HAMANO KENICHI;IMAIZUMI MASAYUKI;SAWADA TAKAO |
分类号 |
H01L21/265;H01L21/336;H01L29/12;H01L29/78 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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