发明名称 INSPECTION CHIP PRODUCING METHOD AND SPECIMEN DETECTING METHOD
摘要 A method of producing an inspection chip includes a microstructure producing step of producing a microstructure where metallic portions having dimensions permitting excitation of surface plasmons are formed and distributed on one surface of a substrate, a specimen attaching step of attaching a specimen to the surfaces of the metallic portions of the microstructure, and a metallic particle attaching step of attaching metallic particles having dimensions permitting excitation of surface plasmons to the metallic portions and the specimen, wherein the specimen is attached to the metallic portions to which no substance capable of specifically binding to the specimen is secured in the specimen attaching step, and/or the metallic particles to which no substance capable of specifically binding to the specimen is secured are attached to the specimen in the metallic particle attaching step.
申请公布号 US2009231586(A1) 申请公布日期 2009.09.17
申请号 US20090390905 申请日期 2009.02.23
申请人 FUJIFILM CORPORATION 发明人 MURAKAMI NAOKI;TOMARU YUICHI
分类号 G01N21/59;B05D5/12;G01N21/55 主分类号 G01N21/59
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