METHOD AND SYSTEM FOR IMPROVED TESTING OF TRANSISTOR ARRAY

摘要

PROBLEM TO BE SOLVED: To achieve testing of an active matrix array before the completion of a system or the like using the active matrix array.

SOLUTION: A system for testing the active matrix array including a plurality of transistors includes: an injecting element operative to apply a driving voltage to the selected transistors of the array; a readout circuit having amplifiers operative to selectively detect output signals; and a control circuit operative to control the injecting element and the readout circuit.

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