| 摘要 |
PROBLEM TO BE SOLVED: To satisfactorily simulate an alternating magnetic field of high frequency in a method of inspecting a magnetic property of a thin-film magnetic head. SOLUTION: (1) A magnetic field application bar B' is arranged opposite to a row bar B so that a magnetic pole chip part of a first magnetic field application element 71 faces a corresponding magnetic field sensor section of a thin-film magnetic head, and a magnetic pole chip part of a second magnetic field application element 72 faces a corresponding lapping guide L, (2) the magnetic field application bar B' and the row bar B are moved relative to each other so that the output voltage of at least one lapping guide L becomes the largest by applying the magnetic field to the lapping guide L from a second magnetic field application element 72 while supplying electricity to the lapping guide L, and (3) the alternating magnetic field is applied, while applying electricity to the magnetic field sensor section, to the magnetic field sensor section of the thin-film magnetic head from a first magnetic field application element 71 while changing magnetic field strength, and a relationship between the intensity of the magnetic field and an output voltage of a magnetic field sensor section is obtained. COPYRIGHT: (C)2009,JPO&INPIT
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