发明名称 Timing generator and semiconductor test apparatus
摘要 A timing generator reduces operation-dependent power consumption (AC component) and noises generated from a clock distribution circuit itself in distributing a clock, and further reduces a skew attributed to the clock distribution. A clock distribution circuit 20 for distributing the clock to timing generating sections 10-l to 10-n has a clock main path 21 connected to a main path buffer 24 and a clock return path 26 connected to a return path buffer 27. A load capacity of the main path buffer 24 is equal to that of the return path buffer 27. Biases of the buffers are the same potential and are generated by a delay locked-loop circuit 30. A propagation delay time of the clock distribution circuit is controlled so as to be an integral multiple of a clock period.
申请公布号 US2009230946(A1) 申请公布日期 2009.09.17
申请号 US20060989714 申请日期 2006.07.28
申请人 SUDA MASAKATSU 发明人 SUDA MASAKATSU
分类号 G01R31/3183;G06F1/04;H03L7/06 主分类号 G01R31/3183
代理机构 代理人
主权项
地址