发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
A semiconductor device and a manufacturing method thereof are provided to prevent a crack of a pad electrode due to stress by supporting an edge of a through hole by a passivation film. An electrode layer(14) is arranged on a first main side of a semiconductor substrate(10). A semiconductor circuit(12) is formed on the semiconductor substrate. An insulation layer has an opening part(16A) which exposes a part of the electrode layer. A through hole(22) exposes a part of the electrode layer. The through hole is positioned in an outer side of an edge of the opening part. The through hole is passed from a second main side of the semiconductor substrate to thickness direction. |
申请公布号 |
KR20090098658(A) |
申请公布日期 |
2009.09.17 |
申请号 |
KR20080125032 |
申请日期 |
2008.12.10 |
申请人 |
OKI SEMICONDUCTOR CO., LTD. |
发明人 |
YAMADA SHIGERU |
分类号 |
H01L23/48;H01L23/055 |
主分类号 |
H01L23/48 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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