发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 A semiconductor device and a manufacturing method thereof are provided to prevent a crack of a pad electrode due to stress by supporting an edge of a through hole by a passivation film. An electrode layer(14) is arranged on a first main side of a semiconductor substrate(10). A semiconductor circuit(12) is formed on the semiconductor substrate. An insulation layer has an opening part(16A) which exposes a part of the electrode layer. A through hole(22) exposes a part of the electrode layer. The through hole is positioned in an outer side of an edge of the opening part. The through hole is passed from a second main side of the semiconductor substrate to thickness direction.
申请公布号 KR20090098658(A) 申请公布日期 2009.09.17
申请号 KR20080125032 申请日期 2008.12.10
申请人 OKI SEMICONDUCTOR CO., LTD. 发明人 YAMADA SHIGERU
分类号 H01L23/48;H01L23/055 主分类号 H01L23/48
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