发明名称 REFLECTION-TYPE MASK AND METHOD OF MAKING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a reflection-type mask which has a reduced shadowing effect and is capable of phase shift exposure with sufficient shading frame performance. <P>SOLUTION: The mask includes: a substrate; a multilayer reflective film which is formed on the substrate; a light-absorber layer which is formed on the multilayer reflective film, and has a phase shift function to emit a part of a given exposure light as a first reflection light and to make the phase of the first reflection light different from that of a second reflection light where the exposure light is emitted to the multilayer reflective film and is reflected thereon; a circuit pattern region formed in the light-absorber layer; and a shading region which is formed outside the circuit pattern region and has a reflectance with respect to the exposure light lower than that in the light-absorber layer located in the circuit pattern region. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009212220(A) 申请公布日期 2009.09.17
申请号 JP20080052198 申请日期 2008.03.03
申请人 TOSHIBA CORP 发明人 TAKAI KOSUKE
分类号 H01L21/027;G03F1/22;G03F1/24 主分类号 H01L21/027
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