发明名称 CONTACT PROBE AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a contact probe that allows for continuity inspection of a minute section to be measured and can ensure durability, and to provide a method for manufacturing the contact probe. SOLUTION: In the contact probe for measuring electric characteristics by obtaining contact pressure to a body to be measured by applying loads to both the ends, the above problems are solved by a probe 1 which includes: a body section A having an insulating cover 3 at the outer periphery of a pin-shaped metal conductor 2c; and an end B made of a metal conductor 2b at a side in contact with the body to be measured, does not have any insulating covers 3, and is machined thinner than a diameter D of a metal conductor 2c in the body section A. In this case, the ratio d/D of a diameter D in the metal conductor 2c of the body section A to a diameter d in the metal conductor 2b of the end B is preferably 0.1 to 0.8 and the diameter Do of the contact probe is preferably 0.025 to 0.12 mm. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009210443(A) 申请公布日期 2009.09.17
申请号 JP20080054219 申请日期 2008.03.05
申请人 TOTOKU ELECTRIC CO LTD 发明人 OTA SOICHI;OKADA YOICHI;YAMAGUCHI TATSUO
分类号 G01R1/067;G01R31/26;H05K3/00 主分类号 G01R1/067
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