Surface plasmon resonance enhanced nonlinear microscopy

摘要

The present invention relates to a nonlinear microscopy method for imaging a sample (S) by means of harmonic generation, characterized in that the electromagnetic field E of the excitation light beam (L) illuminating the sample is amplified by surface plasmon resonance (SPR) at the interface between said sample (S) and a metal layer (5) onto which the sample is lying and said excitation light beam to amplify the intensity of harmonic light beams (2L) in an observation beam reflected or transmitted from the sample. The invention also proposes a microscope to carry out the method of the invention.