发明名称 STACKED 1T-n MEMORY CELL STRUCTURE
摘要 This invention relates to memory technology and new variations on memory array architecture to incorporate certain advantages from both cross-point and 1T-1Cell architectures. The fast read-time and higher signal-to-noise ratio of the 1T-1Cell architecture and the higher packing density of the cross-point architecture are both exploited by combining certain characteristics of these layouts. A single access transistor 16 is used to read multiple memory cells, which can be stacked vertically above one another in a plurality of memory array layers arranged in a "Z" axis direction.
申请公布号 EP1634333(B1) 申请公布日期 2009.09.16
申请号 EP20040785544 申请日期 2004.05.13
申请人 MICRON TECHNOLOGY, INC. 发明人 NEJAD, HASAN;SEYYEDY, MIRMAJID
分类号 H01L27/22;G11C11/15;G11C11/16;H01L21/8246 主分类号 H01L27/22
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