发明名称 METHOD FOR FABRICATING PHASE SHIFT MASK USING OXIDATION TREATMENT
摘要 A method for fabricating a phase shift mask using an oxidation treatment is provided to improve the reflectivity of a pattern surface by suppressing a material which is generated in forming the pattern and a cause of a failure. In a method for fabricating a phase shift mask using an oxidation treatment, a phase shift layer, a light shield layer, and a first antireflection film are formed on a main cell area and a transparent substrate(100) including the frame region. The photoresist layer pattern defining a domain in which the target pattern is formed on the first antireflection film is molded. A first antireflection film pattern and light block film pattern(130) are formed by an etching process using the photoresist layer pattern as a mask. The photoresist layer pattern is removed.
申请公布号 KR20090096971(A) 申请公布日期 2009.09.15
申请号 KR20080022082 申请日期 2008.03.10
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JO, SANG JIN
分类号 H01L21/32 主分类号 H01L21/32
代理机构 代理人
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