发明名称 METHOD FOR FABRICATING ASSIST PATTERN
摘要 <p>A method for fabricating an assist pattern is provided to secure a margin of manufacturing a mask without interference of a process margin, so it forming an assist pattern with a limit level. In a method for fabricating an assist pattern, a layout in which a main pattern(500) is arranged is designed. The assist pattern comprises a first assist pattern(505) and a second assist pattern. The first assist pattern is formed at both sides of the main pattern, and a second assist pattern is extended to the longitudinal direction from the end part of the first assist pattern. The first main patterns are arranged with each other in a main pattern part, and a second main pattern is arranged at the mask end part by a certain space from the first main pattern.</p>
申请公布号 KR20090096969(A) 申请公布日期 2009.09.15
申请号 KR20080022080 申请日期 2008.03.10
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JEONG, GOO MIN
分类号 H01L21/027 主分类号 H01L21/027
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