| 摘要 |
A dimension measuring apparatus 1 which measures a dimension of a measurement subject 2 includes a conveying device 5 which convey the measurement subject 2, a temperature controlling device which control the temperature in a conveyance region 10, 11 to which the measurement subject 2 is conveyed, a dimension measuring device 15 which measure the dimension of the measurement subject 2 conveyed to a measurement portion 6 in the conveyance region 10, 11, and a temperature measuring device 14 which measure the temperature of the measurement subject 2 during dimension measurement by the dimension measuring device 15. The dimension of the measurement subject 2 measured by the dimension measuring device 15 is corrected to a dimension at a predetermined reference temperature using the temperature measured by the temperature measuring device 14.
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