发明名称 MANUFACTURING METHOD OF A SEMICONDUCTOR DEVICE
摘要 <p>A manufacturing method of a semiconductor device is provided to improve a coupling ratio and a gap fill by increasing the contact area of a floating gate and a control gate. In a manufacturing method of a semiconductor device, a first conductive film with a first thickness and a tunnel insulating layer(210) are laminated on the semiconductor substrate(200) in order. A first hard mask pattern(240a) is formed on the first conductive film, and a first conductive film exposed between the first hard mask pattern is etched by a second thickness thinner than first thickness is formed on the first conductive pattern. The first spacer(260) is formed on the sidewall of the first hard mask pattern and the top of the first conductive pattern.</p>
申请公布号 KR20090096868(A) 申请公布日期 2009.09.15
申请号 KR20080021944 申请日期 2008.03.10
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HEO, HYUN
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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