发明名称 Apparatus and method for exposing a substrate to UV radiation while monitoring deterioration of the UV source and reflectors
摘要 Embodiments of the invention relate generally to an ultraviolet (UV) cure chamber for curing a dielectric material disposed on a substrate and to methods of curing dielectric materials using UV radiation. A substrate processing tool according to one embodiment comprises a body defining a substrate processing region; a substrate support adapted to support a substrate within the substrate processing region; an ultraviolet radiation lamp spaced apart from the substrate support, the lamp configured to transmit ultraviolet radiation to a substrate positioned on the substrate support; and a motor operatively coupled to rotate at least one of the ultraviolet radiation lamp or substrate support at least 180 degrees relative to each other. The substrate processing tool may further comprise one or more reflectors adapted to generate a flood pattern of ultraviolet radiation over the substrate that has complementary high and low intensity areas which combine to generate a substantially uniform irradiance pattern if rotated. Other embodiments are also disclosed.
申请公布号 US7589336(B2) 申请公布日期 2009.09.15
申请号 US20070686897 申请日期 2007.03.15
申请人 APPLIED MATERIALS, INC. 发明人 KASZUBA ANDRZEI;ROCHA-ALVAREZ JUAN CARLOS;NOWAK THOMAS;BALUJA SANJEEV;MUKUTI NDANKA O.
分类号 C23C16/453;B05C11/10 主分类号 C23C16/453
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