发明名称 Lithographic apparatus, alignment apparatus, device manufacturing method, and a method of converting an apparatus
摘要 A detector detects liquid in the path of a projection beam or alignment beam. A controller then determines which one or more of a plurality of compensating optical elements may be provided in the optical path of the projection beam or alignment beam in order to focus the projection beam or alignment beam on the surface of the substrate. The appropriate optical element may be placed in the path of the projection beam or alignment beam directly as a final element of the projection system or alignment system respectively.
申请公布号 US7589818(B2) 申请公布日期 2009.09.15
申请号 US20030743266 申请日期 2003.12.23
申请人 ASML NETHERLANDS B.V. 发明人 MULKENS JOHANNES CATHARINUS HUBERTUS;VAN DEN BRINK MARINUS AART;LOOPSTRA ERIK ROELOF
分类号 G03B27/42;G03F7/20;B41C1/10;B41N3/00;G03B27/52;G03F9/00;H01L21/027 主分类号 G03B27/42
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