发明名称 |
TEST CHART FOR SOLID-STATE IMAGING DEVICE, METHOD FOR USING SAME, CHART BOARD, AND TEST DEVICE |
摘要 |
<p>Provided is a test chart for a solid-state imaging device which is smaller than conventional ones. Also provided are a method for using the test chart, and a chart board and a test device provided with the test chart. The test chart for the solid-state imaging device is provided with a circular or concentric annular chart figure with lightness different from that of a background. The test chart is characterized in that the positional relation between plural camera modules and the test chart for the solid-state imaging device is adjusted so that at least one of the chart figures is located within viewing angle ranges of the plural camera modules, and that the resolution is determined by capturing an image of the chart figure by the camera module and then comparing spatial frequencies of an original image represented by the chart figure and the captured image.</p> |
申请公布号 |
WO2009110528(A1) |
申请公布日期 |
2009.09.11 |
申请号 |
WO2009JP54124 |
申请日期 |
2009.03.05 |
申请人 |
SHARP KABUSHIKI KAISHA;NAKAJIMA, YASUSHI;SAEKI, TAKAHIRO;SAITOH, HITOSHI |
发明人 |
NAKAJIMA, YASUSHI;SAEKI, TAKAHIRO;SAITOH, HITOSHI |
分类号 |
G01M11/00;H04N5/232;G03B43/00 |
主分类号 |
G01M11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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